THz-Enhanced DC Ultrafast Electron Diffractometer

Dongfang Zhang; Tobias Kroh; Felix Ritzkowsky; Timm Rohwer; Moein Fakhari; Huseyin Cankaya; Anne-Laure Calendron; Nicholas H. Matlis; Franz X. Kärtner

doi:10.34133/2021/9848526

THz-Enhanced DC Ultrafast Electron Diffractometer

doi: 10.34133/2021/9848526

a Center for Free-Electron Laser Science, Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany
b Collaborative Innovation Center for IFSA, School of Physics and Astronomy, Shanghai Jiao Tong University, 200240 Shanghai, China
c Department of Physics and The Hamburg Centre for Ultrafast Imaging, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany

基金项目:

The authors gratefully acknowledge the expert support from Thomas Tilp and Andrej Berg for the fabrication of the THz device used in this work. This work has been supported by the European Research Council under the European Union’s Seventh Framework Programme (FP7/2007-2013) through the Synergy Grant AXSIS (609920), Project KA908-12/1 of the Deutsche Forschungsgemeinschaft, the Cluster of Excellence “CUI: Advanced Imaging of Matter” of the Deutsche Forschungsgemeinschaft (DFG)—EXC 2056—project ID 390715994, and the Accelerator on a Chip Program (ACHIP) funded by the Gordon and Betty Moore Foundation (GBMF4744).

详细信息

通讯作者:
Correspondence should be addressed to Franz X. Kärtner

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出版历程
- 收稿日期: 2021-04-11
- 修回日期: 2021-06-25
- 刊出日期: 2021-08-25

THz-Enhanced DC Ultrafast Electron Diffractometer

a Center for Free-Electron Laser Science, Deutsches Elektronen Synchrotron, Notkestrasse 85, 22607 Hamburg, Germany
b Collaborative Innovation Center for IFSA, School of Physics and Astronomy, Shanghai Jiao Tong University, 200240 Shanghai, China
c Department of Physics and The Hamburg Centre for Ultrafast Imaging, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany

Funds:

摘要

摘要:
Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.

Abstract:
Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.